Mai 22, 2024 In Unkategorisiert
Unveiling the high-temperature degradation mechanism of cast oxide electrolysis cells via direct imaging of nanoscale interfacial phenomena
Energy Environ. Sci., 2024, Advance Article
DOI: 10.1039/D4EE00896K, Paper
DOI: 10.1039/D4EE00896K, Paper
Open Access
  This article is licensed under a Creative Commons Attribution-NonCommercial 3.0 Unported Licence.
Haneul Choi, Jisu Shin, Changho Yeon, Sun-Young Park, Shin-Tae Bae, Ji Wan Kim, Jong-Ho Lee, Jin-Woo Park, Chan-Woo Lee, Kyung Joong Yoon, Hye Jung Chang
Advanced transmission electron microscopy analysis uncovers the fundamental mechanisms behind nanometer-scale interfacial degradation phenomena in high-temperature solid oxide electrolysis cells.
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Advanced transmission electron microscopy analysis uncovers the fundamental mechanisms behind nanometer-scale interfacial degradation phenomena in high-temperature solid oxide electrolysis cells.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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